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JEOL 8900 RL PDF Print E-mail
THE ELECTRON-MICROPROBE AT THE GEOSCIENCE CENTRE, DEPT. OF GEOCHEMISTRY:

JEOL JXA 8900 RL
TECHNICAL EQUIPMENT


Tungsten- or LaB6- cathode: 0.2 to 40 kV accelerating voltage, beam current 10-12 to 10-5 A; beam current stabilising on all four apertures.

5 wavelength-dispersive spectrometers (WDS)
, one of them highly sensitive ("H-Type") with a small Rowland circle (R=100mm) and JOHANSSON-optics crystals;large range of wavelengths (ca. 0.925 – 0.215 sin-theta); high vacuum, open construction style, no absorption at spectrometer windows.

WDS-detectors: ArCH4 flowcounter, Xe counter, variable counter slits; range of elements Be to U, 14 analysing crystals (5 multilayers). High-perfomance analyzer crystals for optimized for B, C and N.

Energy-dispersive system (EDS) for fast, simultaneous identification of elements; 133 eV resolution (Mn-K-alpha), highly reproducable apertures for the whole beam current-range.

Cool plate and airjet for anticontamination.

Optical microscope: reflected light, transmitted light, polarisation, colour-TV camera.

Vacuum pumps: oil-free rough pumping system ("scroll system") (12 m3/h), magnet bearing turbo molecular pump (300 l/sec) and Ti-ion-getter pump.

Sample stage: any sample format up to a maximum of 100 mm width x 65 mm length x 20 mm depth. Analysable surface: 80 x 80 mm; high precision control of sample stage; microstep mode: 0.02 µm step length.

Trace autofocus system
(TAF): highly reproducable optical "in situ" autofocussing for point analysis and map- and line measurements.

Image methods: secondary electron detection (SE) up to <5 nm lateral resolution, extreme depth of focus due to LDF mode („Large depth of focus“);
backscattered electrons(BSE) in topographical (TOPO) and compositional (COMPO) mode; high sensitivity for atomic numbers (DZ < 0.1);
cathodoluminescence detection (CL): quartz glass-window, wide spectral range: 200-900 nm;
element mappings possible on 5 spectrometers and up to 8 EDS canals simultaneously, combinable with CL, COMPO, TOPO, and SE signals.

Point logger system for pre-selection of measuring points on a modern polarisation microscope with picture digitalisation and saving, which saves valuable working time.

Software: combination of WDS and EDS in all analytical methods; automatic peak identification, spectra deconvolution and semi-quantitative analysis for EDS and WDS. Phase analysis; matrix correction for quantitative analysis: ZAF, XPP (POUCHOU & PICHOIR 1991) and Phi-rho-z (ARMSTRONG 1991) as well as linear calibration. Simultaneous measurement WDS - EDS; addition of several calculated elements; peak overlap correction; thin film procedure; picture digitalisation and archiving.
 
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